TY  - BOOK
AU  - Bushnell, Michael L.
AU  - Agrawal, Vishwani D.
TI  - Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
SN  - 9788132233299
U1  - 621.395 
PY  - 2000///
CY  - New Delhi
PB  - Springer
KW  - Semiconductor storage devices--Testing
KW  - Computer-aided design
KW  - Digital integrated circuits--Testing
KW  - Electronics
ER  -